CNM Seminar Series Speaker Dr. Yoichi Miyahara

November 6, 2013
12:00 pmto1:00 pm

Sponsored by EFRC:CST

Affiliation: Nanoscience & Scanning Probe Microscopy Group, Department of Physics, McGill University

Seminar Title:High-sensitive electrostatic force microscopy on nanostructures: Kelvin force probe microscopy and single-electron charge detection” (abstract)

Location: FNT 1.104

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