Equipment: Keithly 4200SCS Semiconductor Characterization System

Description

The Model 4200-SCS provides a total system solution for DC characterization of semiconductor devices and test structures. This advanced parameter analyzer provides intuitive and sophisticated capabilities for semiconductor device characterization. The 4200-SCS combines unprecedented measurement speed and accuracy with an embedded Windows NT- or XP based PC and the Keithley Interactive Test Environment (KITE) to provide a powerful single-box solution. Model 4200-SCS has:

  • Four Source-Measure Units, including two high power SMUs with 1A/20W capability
  • Two high power SMU's with (200 V max) and two medium power SMU's (20V max)
  • Unique remote preamps extend the resolution of SMUs to 0.1fA
  • Self-contained PC provides fast test setup, power data analysis, graphing and printing, and onboard mass storage of test results

Location

CNM Cleanroom FNT 4.106

Fees

$30.00 per hour for UT Austin users

$54.00 per hour for external university users

$65.00 per hour for corporate users

Facility User Education

To become a user of this instrument please sign up for the next available NT227 facility user education class.  External/Corporate users must contact CNM to setup an account before attending facility user education classes.

Fee: $30.00

Contact

Dr. Damon Smith

damonsmith@austin.utexas.edu

(512) 232-3695