Equipment: Agilent 5500 Atomic Force Microscope


The Agilent 5500 scanning probe microscope (SPM) is equipped with a variety of imaging
modes to measure surface characteristics of samples up to 20x20mm in size. The system is
equipped with a fluid cell for imaging in liquids and a chamber for measurements in a nitrogen
environment. Available scanning techniques: contact mode, acoustic tapping mode, magnetic
tapping mode, phase imaging, lateral force microscopy, magnetic force microscopy, electrostatic
force microscopy, and Kelvin probe microscopy.  Users are provided tips (MikroMasch HQ:NSC15/Cr-Au BS) already mounted on the scanner head.


  • 90 μm by 90 μm scan area
  • Z range of 7 μm
  • Vertical noise of ~0.5 Å RMS


FNT 3.110


$26.00 per hour for UT Austin users

$172.00 per hour for external university users

$172.00 per hour for corporate users

Facility User Education

To become a user of this instrument please sign up for the next available NT221 facility user education class.  External/Corporate users must contact CNM to setup an account before attending facility user education classes.

Fee: $77.00


Dr. Raluca Gearba

(512) 471-2589