Equipment: Agilent 5500 Atomic Force Microscope
The Agilent 5500 scanning probe microscope (SPM) is equipped with a variety of imaging
modes to measure surface characteristics of samples up to 20x20mm in size. The system is
equipped with a fluid cell for imaging in liquids and a chamber for measurements in a nitrogen
environment. Available scanning techniques: contact mode, acoustic tapping mode, magnetic
tapping mode, phase imaging, lateral force microscopy, magnetic force microscopy, electrostatic
force microscopy, and Kelvin probe microscopy. Users are provided tips (MikroMasch HQ:NSC15/Cr-Au BS) already mounted on the scanner head.
- 90 μm by 90 μm scan area
- Z range of 7 μm
- Vertical noise of ~0.5 Å RMS
$26.00 per hour for UT Austin users
$172.00 per hour for external university users
$172.00 per hour for corporate users
Facility User Education
To become a user of this instrument please sign up for the next available NT221 facility user education class. External/Corporate users must contact CNM to setup an account before attending facility user education classes.
Dr. Raluca Gearba